SZT-C fast constant voltage four probe test bench
AddDate: 2022/12/5 12:46:38
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I. Overview of functional and structural features
Add ST2253-F01 probe to test silicon materials Add ST2558B-F01 probe to test film material
Basic functions: SZT-C four probe test bench is a tool used to clamp four point probe, connect four probe test instruments, place samples and conduct manual testing. It is a supporting measuring device (hereinafter referred to as the test bench) for the four probe method resistivity/block resistance (square resistance) instrument.
Basic composition: mainly including loading platform (180mmX180mm net load area), dual rail vertical guide unit, test pressure regulating unit, probe quick lifting wrench (part with red sleeve on the top), probe connecting plate, etc.
Matching and compatibility: this test bench can be equipped with four probe test probes of all models of our company, including tungsten probe four probe probe (for testing hard samples) and gold plated alloy probe (for testing flexible films or coating resistors); This test bench is compatible with all four probe test instruments of our company. This test bench is equipped with the probe of our company, which can be compatible with most four probe resistivity/square resistance test instruments of domestic peers.
II. Main Technical Parameters and Description
Measurable semiconductor material size (probe handheld mode is not limited)
Diameter or side length: direct test mode of SZT-C test bench Φ 15-180mm, or 180mm × 180mm。
Length (or height): direct test method H ≤ 160mm for test bench, and other methods are not limited
Measuring orientation: both axial and radial
III. Usage
IV. Contact Information
Sales Manager: Grace Zheng
Tel.:+8618762109211
Email: zhengjingjing@szjgdz888.com
Alibaba Store: https://szjgdz.en.alibaba.com
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